Real-Time Change Detection for Automated Test Socket Inspection Using Advanced Computer Vision and Machine Learning

发表于 2026-7-16 14:03:10

期刊：IEEE Transactions on Semiconductor Manufacturing

文献作者：Chris Edwards; Alex Vaske; Nathan McDaniel; Dipali Pradhan; Debashis Panda

出版日期：2023-8-

DOI号：10.1109/tsm.2023.3273175

下载链接：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10120673

文献链接：https://doi.org/10.1109/tsm.2023.3273175

当前文献来源于 Institute of Electrical and Electronics Engineers (IEEE)。

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