[SPIE] Enabling nanoimprint simulator for quality verification: process-design co-optimization toward high-volume manufacturing |
10
High-speed GaN-based μ-LED with optimized QW and EBL design for optical interconnect applications
40
CGH Interferometer system for two-dimensional curved x-ray mirror production
10
CGH Interferometer system for two-dimensional curved x-ray mirror production
100
CGH Interferometer system for two-dimensional curved x-ray mirror production