Addressing the High-Voltage Structural and Electrochemical Instability of Ni-Containing Layered Transition Metal (TM) Oxide Cathodes by “Blocking” the “TM-Migration” Pathway in the Lattice

发表于 2026-8-28 15:55:06

期刊：ACS Applied Materials & Interfaces

文献作者：Ankur Sharma; A Rajkamal; Sushobhan Kobi; Bachu Sravan Kumar; Anil Kumar Paidi; Abhijit Chatterjee; Amartya Mukhopadhyay

出版日期：2021-6-9

DOI号：10.1021/acsami.1c01347

下载链接：https://pubs.acs.org/doi/pdf/10.1021/acsami.1c01347

文献链接：https://doi.org/10.1021/acsami.1c01347

当前文献来源于 American Chemical Society (ACS)。

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