Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution

发表于 2026-9-20 13:55:14

期刊：IEEE Transactions on Components, Packaging and Manufacturing Technology

文献作者：Rahman Sajadi; Enes Ugur; Masoud Farhadi; Bhanu Teja Vankayalapati; Ali Saadat; William G. Vandenberghe; Bilal Akin

出版日期：2024-5-

DOI号：10.1109/tcpmt.2024.3385312

下载链接：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10494343

文献链接：https://doi.org/10.1109/tcpmt.2024.3385312

当前文献来源于 Institute of Electrical and Electronics Engineers (IEEE)。

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