Saliency-Guided Transformer Attention With Pixel-Level Contrastive Learning for Weakly Supervised Defect Localization

发表于 2026-9-25 17:20:11

期刊：IEEE Transactions on Industrial Informatics

文献作者：Dejene M. Sime; Nan Ouyang; Kai Sheng; Getu T. Fellek; Wenkang Wan; Adnan A. Qaseem; Xiaojiang Ren; Shehui Bu

出版日期：2026-4-

DOI号：10.1109/tii.2025.3648429

下载链接：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11354152

文献链接：https://doi.org/10.1109/tii.2025.3648429

当前文献来源于 Institute of Electrical and Electronics Engineers (IEEE)。

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[IEEE] Saliency-Guided Transformer Attention With Pixel-Level Contrastive Learning for Weakly Supervised Defect Localization

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