A Novel RUL Prediction Framework Considering the Long-Term Correlation of the Wiener Degradation Process

发表于前天 22:16

期刊：IEEE Transactions on Industrial Electronics

文献作者：Jialong He; Pingting Zhao; Yan Liu; Guofa Li; Liang Wang

出版日期：2026-8-

DOI号：10.1109/tie.2026.3672771

下载链接：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=11455962

文献链接：https://doi.org/10.1109/tie.2026.3672771

当前文献来源于 Institute of Electrical and Electronics Engineers (IEEE)。

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[IEEE] A Novel RUL Prediction Framework Considering the Long-Term Correlation of the Wiener Degradation Process

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