Improving CT Quality for Complex Objects With the Novel Autoexposure Imaging of Stepped Voltage Scanning

发表于 2026-8-21 14:31:36

期刊：IEEE Transactions on Instrumentation and Measurement

文献作者：Yihong Li; Xiaojie Zhao; Yan Han; Ping Chen

出版日期：2023--

DOI号：10.1109/tim.2022.3225022

下载链接：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9964287

文献链接：https://doi.org/10.1109/tim.2022.3225022

当前文献来源于 Institute of Electrical and Electronics Engineers (IEEE)。

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